Multiple-detect ATPG based on physical neighborhoods

Multiple-detect test sets detect single stuck line faults multiple times, and thus have a higher probability of detecting complex defects. But current definitions of what constitutes a new test for a single stuck line fault do not leverage defect locality. Recent work has proposed a new metric to capture quality of a multiple-detect test set based on the number of unique states on lines in the physical neighborhood of a targeted line. This paper presents a new ATPG strategy that uses this metric to generate higher quality multiple-detect test sets.