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A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design - Journal of Electronic Testing
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design - Journal of Electronic Testing
2022
Lu Yingchun
Guangzhen Hu
Jianan Wang
Hao Wang
Liang Yao
Huaguo Liang
Maoxiang Yi
Zhengfeng Huang
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