Thyristor-Based Volatile Memory in Nano-Scale CMOS

2006 
A thyristor-based memory cell technology provides SRAM-like performance at 2times to 3times the density of conventional 6T SRAM. The technology is readily embedded into conventional nano-scale CMOS and scales into future SOI and FinFET technologies. A 19mm 2 0.13mum 9Mb SOI test chip has a 0.562mum 2 cell with a cell-R/W time <2ns
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    5
    References
    5
    Citations
    NaN
    KQI
    []