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Analytical Short-Channel Effect Model for Nanoscale MOSFETs with Ultra-Shallow Junction and Retrograde Channel
Analytical Short-Channel Effect Model for Nanoscale MOSFETs with Ultra-Shallow Junction and Retrograde Channel
2004
Chun-Hsing Shih
Chen-Hsin Lien
Keywords:
Electronic engineering
Short-channel effect
Nanoscopic scale
Materials science
Communication channel
Optoelectronics
shallow junction
Correction
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