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High Resolution Imaging of Graphene on SiC by Contact Resonance AFM: Experiment and Theory
High Resolution Imaging of Graphene on SiC by Contact Resonance AFM: Experiment and Theory
2015
Qing Tu
Bjoern Lange
J.M.J. Lopes
Stefan Zauscher
Volker Blum
Keywords:
Graphene
Nanotechnology
Resonance
Atomic force microscopy
Materials science
Analytical chemistry
high resolution imaging
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