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A Single-Atom Electron Source in Practical Gun of an Extreme High Vacuum
A Single-Atom Electron Source in Practical Gun of an Extreme High Vacuum
2008
Tomohiro Urata
Tsuyoshi Ishikawa
B. Cho
Eiji Rokuta
E. Rokuta
C. Oshima
Ryozo Nonogaki
H. Saito
Akira Yonezawa
Keywords:
Scanning electron microscope
Analytical chemistry
Ultra-high vacuum
Energy filtered transmission electron microscopy
Materials science
Scanning transmission electron microscopy
Atom
Electron beam-induced deposition
Electron
Reflection high-energy electron diffraction
electron source
Optoelectronics
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