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Detecting LED Chip Surface Defects with Modified Faster R-CNN
Detecting LED Chip Surface Defects with Modified Faster R-CNN
2021
Zhiwen Zhang
Qian Gong
Yuan Cao
Cheng Yin
Enyi Yao
Yanhua Liu
Yongqing Pan
Keywords:
Optoelectronics
Chip
Materials science
surface
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