Measurement of electrodynamic parameters of superconducting films in the far-infrared and submillimeter frequency ranges

Possibilities of determing the complex conductivity of thin super-conducting films using far-infrared and submillimeter reflectivity and transmissivity techniques are discussed. It is shown that within the framework of standard approaches a satisfactory accuracy is available only for the imaginary part of the conductivity (dielectric permittivity). Different resonator methods are suggested for measuring the real part of the conductivity. Data for superconducting NbN films at frequencies 3 – 25 cm−1 are presented.