Undesired Effects of CDM Stressing Non-Connected Pins
2018
We show that CDM testing of non-connected pins can result in over-stress or under-stress on the subsequently connected pin tested, and thus can lead to incorrect qualification. Mitigation options are discussed. We show that in particular cases CDM stressing non-connected pins may identify unique fail modes.
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
4
References
1
Citations
NaN
KQI