Improvement in in-plane localization precision of nanoparticles using interference analysis

Amihai Meiri,Carl G. Ebeling,Jason Martineau,Zeev Zalevsky,Jordan M. Gerton,Rajesh Menon

Improvement in in-plane localization precision of nanoparticles using interference analysis

2015

Amihai Meiri
Carl G. Ebeling
Jason Martineau
Zeev Zalevsky
Jordan M. Gerton
Rajesh Menon

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Keywords:

Interference (wave propagation)
Nanoparticle
Optics
Microscopy
Physics
Gaussian
Common emitter
Superresolution
Image resolution
Optoelectronics
Point spread function
Photon

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