Thin Film Evolution Equation for a Strained Anisotropic Solid Film on a Deformable Isotropic Substrate
2018
We consider a continuum model for the evolution of
an epitaxially-strained dislocation-free anisotropic thin solid film on
isotropic deformable substrate in the absence of vapor deposition. By using a
thin film approximation we derived a nonlinear evolution equation. We examined
the nonlinear evolution equation and found that there is a critical film
thickness below which every film thickness is stable and a critical wave number
above which every film thickness is stable.
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