X-ray diffraction characterization and electrical properties of TlIn1 − xGaxTe2 crystals

Single crystals of TlIn1 − x Ga x Te2 solid solutions have been grown and characterized by X-ray diffraction, and their electrical conductivity, Hall coefficient, and thermoelectric power have been measured as functions of temperature. Partial substitution of gallium for indium in TlInTe2 increases its unit-cell parameters.