Thermal annealing induced structural and optical properties of Se72Te25In3 thin films

Thin films of a- Se72Te25In3 were prepared by vacuum evaporation technique in a base pressure of 10−6 Torr on to well cleaned glass substrate. a-Se72Te25In3 thin films were annealed at different temperatures below their crystallization temperatures for 2h. The structural analysis of the films has been investigated using X-ray diffraction technique. The optical absorption spectra of these films were measured in the wavelength range 400-1100 nm in order to derive the absorption coefficient of these films. The optical band gap of as prepared and annealed films as a function of photon energy has been studied. It has been found that the optical band gap decreases with increasing annealing temperatures in the present system.