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Spectral method for determining quantum wells thickness and the composition in strained heterostructures GaAs/InGaAs
Spectral method for determining quantum wells thickness and the composition in strained heterostructures GaAs/InGaAs
2019
N. V. Pavlov
Valery Evstropov
Mikhail A. Mintairov
Sergey A. Mintairov
Nikolay A. Kalyuzhnyy
Keywords:
Quantum well
Heterojunction
Optoelectronics
Spectral method
Materials science
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