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Circuit-Aware Device Reliability Criteria Methodology | NIST
Circuit-Aware Device Reliability Criteria Methodology | NIST
2011
Jason T. Ryan
Lan Wei
Jason P. Campbell
Richard G. Southwick
Kin P. Cheung
Anthony S. Oates
John S. Suehle
Phillip Wong
Keywords:
Electronic engineering
NIST
Materials science
Manufacturing engineering
Reliability engineering
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