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Effect of Cu Incorporation on Optoelectronic Properties of e-Beam Evaporated ZnO thin Films by Ellipsometric Investigations
Effect of Cu Incorporation on Optoelectronic Properties of e-Beam Evaporated ZnO thin Films by Ellipsometric Investigations
2021
Gharieb A. Ali
Said H. Moustafa
M. I. Amer
H. Shaban
M. Emam-Ismail
Essam R. Shaaban
M. El-Hagary
Keywords:
Materials science
Electron beam processing
Thin film
Optoelectronics
Correction
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