Imaging of Subwavelength Features in the Far-Field Using Resonant Metasurfaces: Design from Microwave to Infrared Frequencies

In this paper, we summarize a novel subdiffraction imaging methodology recently reported in [1], and we propose an extension of this work from microwave to infrared frequencies. We show that epsilon-negative and near-zero (ENNZ) metamaterial (MTM)-lined apertures form subwavelength resonators that can be used to perform high-resolution imaging in a frequency-multiplexed scheme. Through careful choice of materials and geometry, we demonstrate imaging of conducting obstacles with a resolution of λ/5 and a minimum obstacle size of λ/6.4 in both the microwave and infrared domains.