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Hot Carrier Reliability of Submicron Ultra Thin SOI-MOSFET's
Hot Carrier Reliability of Submicron Ultra Thin SOI-MOSFET's
1991
Yasuo Yamaguchi
Masahiro Shimizu
Yasuo Inoue
Tadashi Nishimura
Yoichi Akasaka
Keywords:
Nanotechnology
Silicon on insulator
Electronic engineering
MOSFET
Materials science
Optoelectronics
hot carrier reliability
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