Structural and Photoelectrical Properties of Sprayed β-In2S3 Thin Films

β-In 2 S 3 thin films have been prepared by the spray pyrolysis technique. X-ray diffraction (XRD) analysis and scanning electron microscopy (SEM) micrographs showed a good homogeneity of these layers. Microanalysis and XPS measurements have detected little oxygen in the films present in In 2 O 3 form. Photoconductivity measurements were carried out within the range of wavelengths in the visible spectrum at different modulation frequencies f and bias voltages V ranging from 5 to 300 Hz and from 3 to 25 V, respectively. The band gap energy Eg, deduced from these spectra, has approximately the same value as that obtained from spectrophotometric transmission and reflection measurements (Eg = 2.05 eV).