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Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data
Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data
2021
Simon Kamm
Kanuj Sharma
Ingmar Kallfass
Nasser Jazdi
Michael Weyrich
Keywords:
Optoelectronics
Time domain
Power semiconductor device
Materials science
Reflectometry
Correction
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