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Nanometer undulations on CaF2 cleaved surfaces observed by Atomic Force Microscopy
Nanometer undulations on CaF2 cleaved surfaces observed by Atomic Force Microscopy
1996
C. Coupeau
M.K. Small
N. Junqua
J. Grilhé
Keywords:
Nanometre
Materials science
Crystallography
Atomic force microscopy
Nanotechnology
Composite material
Correction
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