Photoelectric effect from CsI by polarized soft x-rays

Studies of the polarization dependence of the photoelectric effect produced by soft X-rays from CsI indicate that the geometrical effects in these experiments can often mimic the polarization signature. This paper presents a detailed calculation of these geometrical effects that are produced when the X-ray beam is not precisely aligned on a rotatable plane photocathode. The experimentally observed geometrical effects were used to precisely determine the realignment of the incident beam of polarized X-rays on a rotatable photocathode. The results allow determinations of the true polarization dependence of the photoemission from CsI. It is shown that the photoelectric effect in CsI depends on the polarization state of the X-rays.