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Standardization of Surface Roughness Measurements of Fine Ceramics Thin Films by Scanning Probe Microscopy
Standardization of Surface Roughness Measurements of Fine Ceramics Thin Films by Scanning Probe Microscopy
2013
Eiji Kusano
Keywords:
Scanning probe microscopy
Surface roughness
Nanotechnology
Ceramic
Thin film
Standardization
Optics
Scanning capacitance microscopy
Scanning ion-conductance microscopy
Analytical chemistry
Materials science
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