Profilometric characterization of DOEs with continuous microrelief
2008
Methodology of local characterization of continuous-relief diffractive optical elements has been discussed. The local
profile depth can be evaluated using "approximated depth" defined without taking a profile near diffractive zone boundaries into account. Several methods to estimate the approximated depth have been offered.
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
7
References
1
Citations
NaN
KQI