Interference effects in two-dimensional electron channeling

Abstract Interference effects have been identified with two-dimensional channeling features in current image diffraction (CID) patterns from Al(001) and Al(111) surfaces. These channeling lines are associated with the emergence conditions of {10} type LEED beams for both surfaces. The interference is seen as pairs of narrow, closely-spaced, parallel lines which move spatially with energy changes as calculated from theory. Because the surface potential barrier is a factor at these low energies in the scattering process, dynamic calculations can be expected to provide information about this part of the surface structure.