Structural, ferroelectric and magnetic properties of lead ferrite (Pb2Fe2O5) thin films synthesized by reactive magnetron deposition

Abstract Lead ferrite (Pb2Fe2O5) thin films were deposited by reactive magnetron sputtering in the (500 - 600)°C temperature range. At room temperature, thin films exhibited remnant polarization of ∼60 µC/cm2 and EC ∼ 90 kV/cm. With the increase of synthesis temperature, ferroelectric properties deteriorate and formed capacitors become lossy. X-ray diffraction pattern demonstrated formation of lead ferrite phase, although lead and iron oxides could not be avoided. It was determined by atomic force microscopy (AFM), that with the increase of temperature, average surface roughness decreases from 25,9 nm to 2,7 nm, possibly due to the surface diffusion. Images of scanning electron microscopy complement AFM data where smoother surfaces are visible. Measured temperature dependences of dielectric permittivity indicated Curie temperature at 783 K. Magnetic susceptibility measurement confirmed Neel magnetic ordering temperature at 540 K.