Common-reflection-surface stack — a real data example

1999 
Abstract The simulation of a zero-offset (ZO) stack section from multi-coverage reflection data is a standard imaging method in seismic processing. It significantly reduces the amount of data and increases the signal-to-noise ratio due to constructive interference of correlated events. Conventional imaging methods, e.g., normal moveout (NMO)/dip moveout (DMO)/stack or pre-stack migration, require a sufficiently accurate macro-velocity model to yield appropriate results, whereas the recently introduced common-reflection-surface stack does not depend on a macro-velocity model. For two-dimensional seismic acquisition, its stacking operator depends on three wavefield attributes and approximates the kinematic multi-coverage reflection response of curved interfaces in laterally inhomogeneous media. The common-reflection-surface stack moveout formula defines a stacking surface for each particular sample in the ZO section to be simulated. The stacking surfaces that fit best to actual events in the multi-coverage data set are determined by means of coherency analysis. In this way, we obtain a coherency section and a section of each of the three wavefield attributes defining the stacking operator. These wavefield attributes characterize the curved interfaces and, thus, can be used for a subsequent inversion. In this paper, we focus on an application to a real land data set acquired over a salt dome. We propose three separate one-parametric search and coherency analyses to determine initial common-reflection-surface stack parameters. Optionally, a subsequent optimization algorithm can be performed to refine these initial parameters. The simulated ZO section obtained by the common-reflection-surface stack is compared to the result of a conventional NMO/DMO/stack processing sequence. We observe an increased signal-to-noise ratio and an improved continuity along the events for our proposed method — without loss of lateral resolution.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    21
    References
    123
    Citations
    NaN
    KQI
    []