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Characterization of an Amorphous $hbox Ge_xhbox Si_1-xhbox O_y$ Microbolometer for Thermal Imaging Applications
Characterization of an Amorphous $hbox Ge_xhbox Si_1-xhbox O_y$ Microbolometer for Thermal Imaging Applications
2005
A. H. Z. Ahmed
R. N. Tait
Keywords:
Microbolometer
Physics
Thermal
Amorphous solid
Analytical chemistry
Optoelectronics
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