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The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
2009
Felice Crupi
Paolo Magnone
Eddy Simoen
Abdelkarim Mercha
Luigi Pantisano
Gino Giusi
Calogero Pace
Cor Claeys
Keywords:
Optoelectronics
High-κ dielectric
Stack (abstract data type)
Materials science
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