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Simulation tool for the prediction of heavy ion cross section of innovative 130 nm SRAMs
Simulation tool for the prediction of heavy ion cross section of innovative 130 nm SRAMs
2007
Correas
Saigne
Sagnes
Boch
Gasiot
Giot
Keywords:
Solid modeling
Semiconductor device modeling
heavy ion
Optoelectronics
Cross section (physics)
random access memory
Ion
Capacitor
Materials science
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