Compendia of TID and SEE test results of space qualified integrated circuits

Phil Layton,Gale Williamson,Ed Patnaude,Larry Longden,Chad Thibodeau,Boris Kazak,Clarence Sloan

Compendia of TID and SEE test results of space qualified integrated circuits

2003

Phil Layton
Gale Williamson
Ed Patnaude
Larry Longden
Chad Thibodeau
Boris Kazak
Clarence Sloan

SEE and TID data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.

Keywords:

Radiation effect
Electrical engineering
Space technology
Engineering
Absorbed dose
Potential space
Threshold voltage
Radiation
Electronic engineering
Single event upset
Integrated circuit
ion accelerators
single event latchup

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