Spacer layer properties in antiferromagnetically coupled Fe/SixFe1−x

T. Luciński,P. Wandziuk,J. Baszyński,F. Stobiecki,J. Zweck

Spacer layer properties in antiferromagnetically coupled Fe/SixFe1−x

2006

T. Luciński
P. Wandziuk
J. Baszyński
F. Stobiecki
J. Zweck

Abstract The antiferromagnetically coupled Fe/Si x Fe 1− x multilayers deposited in UHV by magnetron sputtering onto oxidized Si wafers for different Fe layer thicknesses 0.3 nm d Fe

Keywords:

Sputter deposition
Thin film
Electron transport chain
Wafer
Electrical resistivity and conductivity
Materials science
Analytical chemistry
Electronic structure
Thin layers
Perpendicular
electronic properties

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