Microstructure, Ferroelectric and Piezoelectric Properties of Bi4Ti3O12 Platelet Incorporated 0.36BiScO3-0.64PbTiO3 Thick Films for High Temperature Piezoelectric Device Applications

Abstract Bi4Ti3O12 (BiT) platelet incorporated 0.36BiScO3-0.64PbTiO3 (BS-PT) thick films were successfully developed for high temperature piezoelectric device applications. Their microstructure and ferroelectric and piezoelectric properties were systematically investigated to demonstrate the effect of the BiT template. It was found that the incorporation of BiT template was not responsible for textured grain growth of the BS-PT thick films; however, it could result in grain growth and densification of the BS-PT thick films by optimizing the sintering temperature and amount of BiT template. In particular, a 4 wt% BiT-incorporated BS-PT thick film sintered at 1000°C exhibited a pure perovskite structure and excellent piezoelectric properties of d33 (440 pC/N) and kp (53%), despite the presence of micro-pores caused by molten BiT. The BS-PT thick film, exhibiting good ferroelectric characteristics of Pr of 39.4 μC/cm2 and Ec of 3.0 kV/mm at 1 kHz, also had an extremely high Tc of approximately 402°C. This implies that the BiT platelet incorporated BS-PT thick film is applicable for high temperature piezoelectric devices.