Old Web
English
Sign In
Acemap
>
Paper
>
Thin film characterization using high frequency eddy current spectroscopy
Thin film characterization using high frequency eddy current spectroscopy
2009
Heuer
Hillmann
Roellig
Wolter
Keywords:
Eddy-current testing
characterization
Materials science
Nondestructive testing
Eddy current
Thin film
Spectroscopy
Spectrometer
Conductivity
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]