Old Web
English
Sign In
Acemap
>
Paper
>
Advances in EBSD sample preparation by broad ion beam milling
Advances in EBSD sample preparation by broad ion beam milling
2021
Laurie Palasse
Paweł Nowakowski
Keywords:
Metallurgy
Sample preparation
Materials science
Electron backscatter diffraction
Ion beam
Correction
Source
Cite
Save
Machine Reading By IdeaReader
7
References
0
Citations
NaN
KQI
[]