Film thickness measurements around curved surfaces using a microscope-based reflectometer

Christine Cecala,Lirong Pei,Arnette Brooks,David John Brockway,Evan Bittner,Karl W. Koch

Film thickness measurements around curved surfaces using a microscope-based reflectometer

2016

Christine Cecala
Lirong Pei
Arnette Brooks
David John Brockway
Evan Bittner
Karl W. Koch

A commercial microscope-based reflectometer was modified and a custom measurement protocol and analysis regimen were developed for characterization of coatings around curved surfaces.

Keywords:

Optical fiber
Image resolution
Microscope
Optics
Materials science

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