Some algorithms for data analysis in interference wavefront detectors

Several comments may be made. Two method of organizing interference-pattern scanning may be organized. The first entails invoking the points of a scan from a dense Cartesian raster stored in a computer memory, while for each subsequent point the given scan-selection condition must be verified. The second involves controlling the scanning aperture, when the satisfaction of the selection condition is verified by a servosystem, changing the scanning line as necessary. No excess information is stored in the computer here. The comparative characteristics of these two versions remain to be elucidated.