Old Web
English
Sign In
Acemap
>
Paper
>
Trap Characterization of Atomic-Layer-Deposited Al-Incorporated HfO2 Films on In0.53Ga0.47As
Trap Characterization of Atomic-Layer-Deposited Al-Incorporated HfO2 Films on In0.53Ga0.47As
2021
Md. Mamunur Rahman
Tae-Woo Kim
Keywords:
Trap (computing)
Materials science
Analytical chemistry
layer
characterization
Correction
Source
Cite
Save
Machine Reading By IdeaReader
50
References
0
Citations
NaN
KQI
[]