Study of the wall effect of the sample position well of the Frisch-grid ionization chamber

Abstract When measuring the charged particles using a Frisch-grid ionization chamber, the sample is usually placed at the bottom of a sample position well on the common cathode. Thus, there will be the wall effect of the sample position well and this will change the measured energy spectrum of the charged particles. The wall effect of the sample position well is proved to be noticeable by the present work using experiments and simulations.