Old Web
English
Sign In
Acemap
>
Paper
>
COSIMA - Secondary time-of-flight secondary ion mass spectrometer (SIMS) onboard ROSETTA: instrument overview
COSIMA - Secondary time-of-flight secondary ion mass spectrometer (SIMS) onboard ROSETTA: instrument overview
2006
J. Kissel
Kathrin Altwegg
B. C. Clark
L. Colangeli
H. Cottin
S. Czempiel
J. Eibl
C. Engrand
H. M. Fehringer
B. Feuerbacher
Marina N. Fomenkova
A. Glasmachers
J. M. Greenberg
E. Grün
G. Haerendel
H. Henkel
M. Hilchenbach
H. von Hoerner
H. Höfner
Klaus Hornung
E. K. Jessberger
A. Koch
Harald Krüger
Y. Langevin
P. Parigger
F. Raulin
F. Rüdenauer
J. Rynö
Erich R. Schmid
R. Schulz
J. Silen
W. Steiger
Thomas G. Stephan
L. Thirkell
Roger C. Thomas
K. Torkar
N. G. Utterback
Kurt Varmuza
K.P. Wanczek
Wolfgang Werther
H. Zscheeg
Keywords:
Secondary ion mass spectrometry
Analytical chemistry
Time of flight
Chemistry
Nuclear physics
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]