Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)

Nicholas A. Güsken,Alberto Lauri,Yi Li,Takayuki Matsui,Anna Regoutz,Brock Doiron,Ryan Bower,Andrei P. Mihai,Rupert F. Oulton,Peter K. Petrov,Lesley F. Cohen,Stefan A. Maier

Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)

2020

Nicholas A. Güsken
Alberto Lauri
Yi Li
Takayuki Matsui
Anna Regoutz
Brock Doiron
Ryan Bower
Andrei P. Mihai
Rupert F. Oulton
Peter K. Petrov
Lesley F. Cohen
Stefan A. Maier

This Conference Presentation, "Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions" was recorded at Photonics West 2020 held in San Francisco, California, United States.

Keywords:

Oxide
metal thin film
Optoelectronics
Materials science
Titanium dioxide
Metal
Photonics
Titanium nitride

Correction
Source
Cite
Save
Machine Reading By IdeaReader

References

Citations