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Interrogation of a single ion for optical metrology
Interrogation of a single ion for optical metrology
2006
C Lisowski
Didier GuyomarcH
Marie Houssin
M Vedel
Martina Knoop
F. Vedel
Gaetan Hagel
Caroline Champenois
Keywords:
Metrology
Interrogation
Analytical chemistry
Ion
Materials science
Optoelectronics
single ion
optical metrology
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