A highly reliable embedded p-channel SONOS memory using dynamic programming method
2011
In this paper we propose a dynamic programming scheme in p-channel SONOS operation in order to achieve high reliability and scalability. By adopting the new method, cell can perform better writing efficiency and suffer less oxide degradation than the conventional CHE programming. Besides, the low programming current under the low program bias also makes simple circuitry design and small charge pumping area.
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