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「ゲート絶縁膜/Si界面の評価」低速陽電子ビームを用いたhigh‐κ膜の空隙評価
「ゲート絶縁膜/Si界面の評価」低速陽電子ビームを用いたhigh‐κ膜の空隙評価
2005
meiryou ue dono
masakazu gotou
keiiti higuti
tunehira ikeuti
kikuo yamabe
kenzi siroisi
yutaka hirosi ti kyou
keisaku yamada
hirosi kitazima
riitirou mituhasi
atusi horiuti
wa kou torii
kei tosi arikado
ryouiti suzuki
tosiyuki oohira
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