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Study of Oxygen Migration at Pt/HfO2/Pt Interface by Bias-application Hard X-ray Photoelectron Spectroscopy
Study of Oxygen Migration at Pt/HfO2/Pt Interface by Bias-application Hard X-ray Photoelectron Spectroscopy
2011
kobayasi keisuke
yamasita yosiyuki
nagata takahiro
Keywords:
Analytical chemistry
Oxygen
X-ray photoelectron spectroscopy
Materials science
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