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Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM
Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM
2020
AC Bouman
J.W. Jansen
M. Griebling
L. Lammers
VM Santos Costa
Jja Vermeulen
Jga Vervloat
Afj Hammen
H.W. Zandbergen
Keywords:
Conductivity
Composite material
thin metal
Grain growth
Dewetting
Materials science
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