X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN
2006
The crystalline quality in epitaxially laterally overgrown
(ELO) GaN and the amount of wing tilt is characterized on a
local basis, with high spatial and angular resolution. A method
of full-field X-ray microdiffraction imaging, termed rocking
curve imaging, is used to record simultaneously a large set of
local X-ray diffraction profiles originating from sample
surface areas of micrometer size. x-omega maps of diffracted
intensity allow to quantify the amount of wing tilt in
individual lateral ELO periods as well as to monitor the
fluctuations of tilt between adjacent periods. Automated shape
analysis of the full set of local rocking curves provides a
means to quantitatively characterize the local crystalline
perfection of GaN. The ELO window and wing regions can be
clearly separated; comparison indicates an average improvement
of crystal quality by a factor 3–4 due to the lateral
overgrowth process.
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