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Electron bunch length characterization at the Metrology Light Source using THz radiation
Electron bunch length characterization at the Metrology Light Source using THz radiation
2016
Andreas Pohl
Nils Deßmann
Arne Hoehl
R. Müller
G. Ulm
Markus Ries
G. Wüstefeld
Sergey Pavlov
H.-W. Hübers
Keywords:
Metrology
Radiation
Nuclear magnetic resonance
Terahertz radiation
Electron
Chemistry
Analytical chemistry
light source
Optics
thz radiation
Correction
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