A statistical approach for the determination of the probability of upset of digital circuits

In this paper, a statistical method is proposed for the determination of the probability of circuit upset due to an electromagnetic (EM) transient. This method has the advantage that control of the timing of the transient EM pulse relative to the operational cycle of the circuit is not required. Nor, in fact, is detailed knowledge of the susceptible portion of the circuit. This method has been demonstrated experimentally by studying the susceptibility of a model circuit to upset when exposed to an electromagnetic transient.