Applications of the 45° reflectometry in the study of optical properties of confined semiconductor systems

Abstract We analyze the spectra of the 45° reflectometry, given by the difference R p − R s 2 between the reflectivity for p-polarized light ( R p ) and the squared reflectivity for s-polarized light ( R s 2 ) at 45° angle of incidence, in both phonon and excitonic frequency ranges. It is shown that this spectroscopy can be useful for investigating quantized optical phonons in superlattices, and confined exciton–polaritons in thin films and near-surface transition layers.